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同大类学科其它级别期刊：

中科院 1区期刊 JCR Q1 期刊中科院 2区期刊 JCR Q2 期刊中科院 3区期刊 JCR Q3 期刊中科院 4区期刊 JCR Q4 期刊

Journal Of Electronic Testing-theory And Applications

SCI SCIE

国际简称：J ELECTRON TEST 参考译名：电子测试理论与应用杂志

主要研究方向：工程技术-工程：电子与电气非预警期刊审稿周期：较慢,6-12周

《电子测试理论与应用杂志》(Journal Of Electronic Testing-theory And Applications)是一本由Springer US出版的以工程技术-工程：电子与电气为研究特色的国际期刊，发表该领域相关的原创研究文章、评论文章和综述文章，及时报道该领域相关理论、实践和应用学科的最新发现，旨在促进该学科领域科学信息的快速交流。该期刊是一本未开放期刊，近三年没有被列入预警名单。

4区中科院分区
Q4 JCR分区
44 年发文量
1.2 IF影响因子
未开放 是否OA
31 H-index
1990 创刊年份
Bimonthly 出版周期
English 出版语言

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:

Testing of VLSI devices printed circuit boards, and electronic systems;

Testing of analog and digital electronic circuits;

Testing of microprocessors, memories, and signal processing devices;

Fault modeling;

Test generation;

Fault simulation;

Testability analysis;

Design for testability;

Synthesis for testability;

Built-in self-test;

Test specification;

Fault tolerance;

Formal verification of hardware;

Simulation for verification;

Design debugging;

AI methods and expert systems for test and diagnosis;

Automatic test equipment (ATE);

Test fixtures;

Electron Beam Test Systems;

Test programming;

Test data analysis;

Economics of testing;

Quality and reliability;

CAD Tools;

Testing of wafer-scale integration devices;

Testing of reliable systems;

Manufacturing yield and design for yield improvement;

Failure mode analysis and process improvement

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Journal Of Electronic Testing-theory And Applications期刊信息

ISSN：0923-8174
出版语言：English
是否OA：未开放
E-ISSN：1573-0727
出版地区：UNITED STATES
是否预警：否
出版商：Springer US
出版周期：Bimonthly
创刊时间：1990
开源占比：0.047
Gold OA文章占比：10.00%
OA被引用占比：0.0092...
出版国人文章占比：0
出版撤稿占比：0
研究类文章占比：100.00%

Journal Of Electronic Testing-theory And Applications CiteScore评价数据（2026年6月最新版）

CiteScore

SJR

SNIP

CiteScore 指数

2.7

0.282

0.512

学科类别	分区	排名	百分位
大类：Engineering 小类：Electrical and Electronic Engineering	Q2	511 / 1030	50%

名词解释：CiteScore 是衡量期刊所发表文献的平均受引用次数，是在 Scopus 中衡量期刊影响力的另一个指标。当年CiteScore 的计算依据是期刊最近4年（含计算年度）的被引次数除以该期刊近四年发表的文献数。例如，2022年的 CiteScore 计算方法为：2022年的 CiteScore =2019-2022年收到的对2019-2022年发表的文件的引用数量÷2019-2022年发布的文献数量注：文献类型包括：文章、评论、会议论文、书籍章节和数据论文。

Journal Of Electronic Testing-theory And Applications中科院评价数据

《新锐期刊分区表》（2026年3月发布）

Top期刊	综述期刊	大类学科		小类学科
否	否	工程技术	4区	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气	4区

Journal Of Electronic Testing-theory And Applications JCR评价数据

2025-2026年最新版

按JCI指标学科分区	收录子集	分区	排名	百分位
学科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q4	310 / 369	16.1
学科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q4	295 / 371	20.62

Journal Of Electronic Testing-theory And Applications历年数据统计

影响因子

中科院分区

Journal Of Electronic Testing-theory And Applications中国学者发文选摘

1、Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognitio
Author: Ni, Tianming; Yu, Meifang; Chen, Xiaofei; Liang, Huaguo; Wang, Senling; Cheng, Muyang; Nie, Mu

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06224-7
2、Study on Analysis and Troubleshooting Methods for Common Faults of a Certain Type of On-board Recorde
Author: Wang, Ning; Fan, Xiang; Zhou, Zhenquan; Zheng, Lihong

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06230-9
3、ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Functio
Author: Chen, Shouhong; Han, Lingfeng; Wei, Cong; Zhu, Ziren; Hou, Xingna; Guo, Ling

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06229-2
4、An Efficient Cybersecurity Method to Detect Phishing Attacks Integrating Heuristic-Driven Feature Optimizer and Deep Learning Algorithm
Author: Li, Shaoju; Bouyer, Asgarali; Arasteh, Bahman

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06233-6
5、SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detectio
Author: Du, Xianjun; Wang, Jingxiang

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06220-x
6、SRAM PUF Preselection Method Based on Neighboring Spatial Majority Votin
Author: Shi, Tianyao; Chen, Sining; Chen, Haijin

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-025-06214-1
7、Average Relative SNR: New Metric to Evaluate the Attack Performance of Non-Profiled Side-Channel Trace
Author: Tang, Cheng; Li, Lang

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06218-5
8、PN-SCA: A High Generalization and Fast Profiled SCA Based on Prototypical Network
Author: Ou, Yu; Wei, Yongzhuang; Ou, Changhai; Pasalic, Enes

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06219-4